Biangular Reflectance and Elliptometry on the Nano-Scale Dissertation or Thesis by Writing Specialists

Biangular Reflectance and Elliptometry on the Nano-Scale
An in-depth discussion regarding the need for the broader impacts of a scientifically and technologically literate and diverse workforce, and a review of the University of Central Oklahoma's optical/thermal scattering facility research project.
# 92336 | 5,846 words | 35 sources | MLA | 2006 | US
Published on Feb 19, 2007 in Physics (Optics) , Medical and Health (General) , Research Designs (General) , Physics (General)


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Description:

This paper discusses how engineering encounters many surfaces that posses vast quantities of irregularities and application of fundamental theories neither proves practical nor precise in obtaining true representations due to these irregularities. The paper further discusses how there exists a need for accuracy in thermo-physical property data in both industrial applications which demand a reliable method of determining data. According to the paper, this need can be met by the establishment of the optical/thermal scattering facility at the University of Central Oklahoma. The paper then reviews the advantages and disadvantages of this research program.

Outline:

Introduction
Importance of the Research
Review of the Literature
Scope of Academic Benefits
Research and Academic
Management Plan and Timeline
Dissemination and Sustainability
Evaluation
Summary and Conclusion
Methodology

From the Paper:

"This project also plans to augment the radiative heat transfer science behind this experimentation. The Hemispherical Scatterometer will be constructed based on the most widely used methods for solution of the radiative transfer equation (RTE) and the discrete ordinate method (DOM). Despite the fact that there has been a wide construction of similar apparatuses for BRDF determination [4,15,17,18,33-35,40,43-46] there has not been any device that makes use of the quadrature scheme of the DOM to obtain this property. By using the DOM theory, commercial computational fluid dynamic (CFD) software can be easily incorporated to develop new research and/or mathematical models. These involve heat transfer problems to be compared with standard or previous models. Another aspect where the PI's project will certainly have an impact on the community is in the surface and cataloging of pattern recognition of the mentioned surfaces. Many surfaces in engineering, specially the ones dealt in this project will perhaps contain roughness characteristics similar to the ones shown in Figure 4. Even though is a very smooth material (looked through one's eye) theoretical prediction of reflectance or surface properties is not feasible. However, performing cataloging and pattern recognition is a method that will allow us to recognize intrinsic features of materials and provide a deeper knowledge of material's use and extended applicability. At the same time possible complication while using textbook calculations comes from the fact that they take the surface to be an homogeneous material rather than, say, a layered structure without considering subsurface complications or they are too cumbersome to apply. Therefore, the result is that actual measurement of the reflectance function is the best way to determine this radiative property and measure it in such manner that could also be applied to radiation heat transfer solution method or any other industrial application. This is again, where this project takes the lead."

Sample of Sources Used:

  • Kollias, Nikiforos et al eds (2005) Out-of-plan polarimetric imaging of skin: Surface and subsurfance effects". Society of Photo-Optical Instrumentation Engineers. Photonic Therapeutics and Diagnostics Journal. Nikiforos Kollias, et al, Eds Proc SPIE 5686 142-153 (2005)
  • R.R. Anderson, "Polarized light examination and photography of the skin." Arch. Dermatol. 127, 1000-1005, (1991)
  • S. L. Jacques, J. C. Ramella-Roman, K. Lee. "Imaging skin pathology with polarized light," J. Biomed. Optics, 7, 329-340, (2002).
  • T. A. Germer and C. C. Asmail, "Polarization of light scattered by microrough surfaces and subsurface defects", J. Opt. Soc. Am. A, 16, 1326-1332 (1999).
  • S. Saidi, S. L. Jacques, F. K. Tittel, "Mie and Rayleigh modeling of visible-light scattering in neonatal skin," Applied Optics 34, 7410-7418, (1995).

Cite this Dissertation or Thesis:

APA Format

Biangular Reflectance and Elliptometry on the Nano-Scale (2007, February 19) Retrieved July 16, 2019, from https://www.academon.com/dissertation-or-thesis/biangular-reflectance-and-elliptometry-on-the-nano-scale-92336/

MLA Format

"Biangular Reflectance and Elliptometry on the Nano-Scale" 19 February 2007. Web. 16 July. 2019. <https://www.academon.com/dissertation-or-thesis/biangular-reflectance-and-elliptometry-on-the-nano-scale-92336/>

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